Main Phone: (413) 589-8970
The RF Lab at BTP Systems contains an array of advanced test equipment, the corner stone of which is an Agilent Series E8364C 50 GHz PNA the industry's highest performing network analyzer, offering linear and non-linear component characterization for both passive and active devices. This is accompanied by an Agilent N8975A NFA Series Noise Figure Analyzer which allows for fast, accurate, and repeatable noise figure measurements.
The lab also contains two different complete test stations set-up to enable testing up to 110 GHz. These independent stations all contain their own Agilent 83650B Series Swept-Signal Generators (10 MHz to 50 GHz), Agilent 83558A Millimeter-Wave Source Modules (75 GHz to 110 GHz) for the generation of test signals and Agilent 8757D Scalar Network Analyzers and Agilent 85025C Waveguide Detector Adapter (up to 110 GHz) for measurements of the system outputs. In addition to these set-ups the lab contains multiple E4418B EPM Series Power Meters with V8486A Power Sensors (50 GHz to 75 GHz) for accurate power readings.
Other, lower frequency test stations are also available utilizing the same 8757D Scalar Network Analyzers but with 83640L Synthesized Swept-CW Generators (10 MHz to 40 GHz), 83630B Synthesized Swept-Signal Generators (10 MHz to 26.5 GHz), and 83752B High Power Synthesized Sweepers (10 MHz to 20 GHz). Additional power meters with lower frequency power sensors such as the Q8486A Waveguide Power Sensor (33 GHz to 50 GHz) and the N8481A Power Sensors (10 MHz to 18 GHz) are also available. The RF Lab also contains two 8565E Portable Spectrum Analyzers (9 kHz to 50 GHz) in addition to an 8564E Portable Spectrum Analyzer (9 kHz to 40 GHz).
The RF Lab is rounded off by having a number of additional pieces of test equipment available, including a Tektronix CSA 8000 Communications Signal Analyzer, high speed oscilloscopes, dedicated mixers, and power supplies up to 300 VDC, all complimented by an extensive set of variable/fixed attenuators (coaxial and waveguide up to 110 GHz), couplers, circulators, isolators, waveguides, SMA cabling, and various terminations.
The RF lab at BTP Systems also has three temperature plates (both mechanical and cryogenic via LN2 operated) with programmable interfaces for complete automated temperature profiling. Two microscope stations with 40x magnification allow for detailed inspection of components such as wire bonding integrity, FET gate conditions, and other PCB troubleshooting. BTP Systems has designed and manufactured a number of custom component interfaces to facilitate the testing and repair of complex systems as required.